By Bharat Bhushan, Harald Fuchs

ISBN-10: 3540850481

ISBN-13: 9783540850489

The volumes XI, XII and XIII research the actual and technical beginning for contemporary growth in utilized scanning probe options. the 1st quantity got here out in January 2004, the second one to fourth volumes in early 2006 and the 5th to 7th volumes in past due 2006. the sphere is progressing so quickly that there's a desire for a collection of volumes each 12 to 18 months to trap most recent advancements. those volumes represent a well timed accomplished evaluate of SPM functions. After introducing scanning probe microscopy, together with sensor expertise and tip characterization, chapters on use in a variety of business purposes are offered. business purposes span topographic and dynamical floor experiences of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. The chapters were written through major researchers and alertness scientists from around the globe and from numerous industries to supply a broader viewpoint.

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Extra info for Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications (NanoScience and Technology) (No. XIII)

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Com 33. Jaques RL (1988) The potato beetles. The genus Leptinotarsa in North America (Coleoptera: Chrysomelidae). Flora & Fauna Handbook, no. 3, E. J. Brill, Leiden, New York, Kobenhavn, K¨oln 34. Rivnay E (1928) External morphology of the Colorado beetle (Leptinotarsa decemlineata Say). J New York Entomol Soc 26:25–145 35. Scherge M, Gorb SN (2001) Biological micro- and nanotribology. Springer, Berlin Heidelberg New York 36. Langer MG, Ruppersberg JP, Gorb S (2004) Adhesion forces measured at the level of a terminal plate of the fly’s seta.

257 35 Scanning Probe Microscopy in Biological Research Tatsuo Ushiki, Kazushige Kawabata . . . . . . . . . 285 Novel Nanoindentation Techniques and Their Applications Jiping Ye . . . . . . . . . . . . . . . . 309 36 XLIV 37 38 Contents – Volume X Applications to Nano-Dispersion Macromolecule Material Evaluation in an Electrophotographic Printer Yasushi Kadota . . . . . . . . . . . . . . 347 Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing Tianming Bao, David Fong, Sean Hand .

23 Low-Noise Methods for Optical Measurements of Cantilever Deflections Tilman E. Schäffer . . . . . . . . . . . . . . 51 Q-controlled Dynamic Force Microscopy in Air and Liquids Hendrik H¨olscher, Daniel Ebeling, Udo D. Schwarz . . . . 75 High-Frequency Dynamic Force Microscopy Hideki Kawakatsu . . . . . . . . . . . . . . 99 Torsional Resonance Microscopy and Its Applications Chanmin Su, Lin Huang, Craig B. Prater, Bharat Bhushan . . . 113 Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy Yaxin Song, Bharat Bhushan .

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Applied Scanning Probe Methods XIII: Biomimetics and Industrial Applications (NanoScience and Technology) (No. XIII) by Bharat Bhushan, Harald Fuchs

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